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Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 /
Institutionell upphovsman: | |
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Övriga upphovsmän: | , |
Materialtyp: | Printed Book |
Språk: | English |
Publicerad: |
Bristol ;
Institute of Physics Pub.,
1998.
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Serie: | Institute of physics series;
no. 160 |
Ämnen: |
PHY
Signum: |
621.3815/2 DON |
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Exemplar | Status otillgänglig |