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Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 /
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| Другие авторы: | , |
| Формат: | Printed Book |
| Язык: | English |
| Опубликовано: |
Bristol ;
Institute of Physics Pub.,
1998.
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| Серии: | Institute of physics series;
no. 160 |
| Предметы: |
PHY
| Шифр: |
621.3815/2 DON |
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| Копировать | Недоступно состояние Live" What does mean the status Live (working) |