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Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 /
| Autor Corporativo: | |
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| Outros Autores: | , |
| Formato: | Printed Book |
| Idioma: | English |
| Publicado em: |
Bristol ;
Institute of Physics Pub.,
1998.
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| Colecção: | Institute of physics series;
no. 160 |
| Assuntos: |
PHY
| Área/Cota: |
621.3815/2 DON |
|---|---|
| Cód. Barras: | Informação em tempo real indisponível |