Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 /

ग्रंथसूची विवरण
निगमित लेखक: International Conference on Defect Recognition and Image Processing in Semiconductors Templin, Germany
अन्य लेखक: Donecker, J., ed, Rechenberg, I., ed
स्वरूप: Printed Book
भाषा:English
प्रकाशित: Bristol ; Institute of Physics Pub., 1998.
श्रृंखला:Institute of physics series; no. 160
विषय:
Semiconductors--Defects--Congresses. > Image processing--Congresses.

PHY

होल्डिंग्स विवरण से PHY
बोधानक: 621.3815/2 DON
प्रति लाइव स्थिति उपलब्ध नहीं है

समान संसाधन