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Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 /
| Erakunde egilea: | |
|---|---|
| Beste egile batzuk: | , |
| Formatua: | Printed Book |
| Hizkuntza: | English |
| Argitaratua: |
Bristol ;
Institute of Physics Pub.,
1998.
|
| Saila: | Institute of physics series;
no. 160 |
| Gaiak: |
PHY
| Sailkapena: |
621.3815/2 DON |
|---|---|
| Alea | Egoera zuzenean ez dago erabilgarri |