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Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 /

Manylion Llyfryddiaeth
Awdur Corfforaethol: International Conference on Defect Recognition and Image Processing in Semiconductors Templin, Germany
Awduron Eraill: Donecker, J., ed, Rechenberg, I., ed
Fformat: Printed Book
Iaith:English
Cyhoeddwyd: Bristol ; Institute of Physics Pub., 1998.
Cyfres:Institute of physics series; no. 160
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Rhif Galw: 621.3815/2 DON
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