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Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 /

書目詳細資料
企業作者:	International Conference on Defect Recognition and Image Processing in Semiconductors Templin, Germany
其他作者:	Donecker, J., ed, Rechenberg, I., ed
格式:	Printed Book
語言:	English
出版:	Bristol ; Institute of Physics Pub., 1998.
叢編:	Institute of physics series; no. 160
主題:	Semiconductors--Defects--Congresses. > Image processing--Congresses.

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