Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 /

Détails bibliographiques
Collectivité auteur: International Conference on Defect Recognition and Image Processing in Semiconductors Templin, Germany
Autres auteurs: Donecker, J., ed, Rechenberg, I., ed
Format: Printed Book
Langue:English
Publié: Bristol ; Institute of Physics Pub., 1998.
Collection:Institute of physics series; no. 160
Sujets:
Semiconductors--Defects--Congresses. > Image processing--Congresses.

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