Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 /

Bibliografske podrobnosti
Korporativna značnica: International Conference on Defect Recognition and Image Processing in Semiconductors Templin, Germany
Drugi avtorji: Donecker, J., ed, Rechenberg, I., ed
Format: Printed Book
Jezik:English
Izdano: Bristol ; Institute of Physics Pub., 1998.
Serija:Institute of physics series; no. 160
Teme:
Semiconductors--Defects--Congresses. > Image processing--Congresses.

PHY

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Signatura: 621.3815/2 DON
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