Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 /

Bibliografische gegevens
Coauteur: International Conference on Defect Recognition and Image Processing in Semiconductors Templin, Germany
Andere auteurs: Donecker, J., ed, Rechenberg, I., ed
Formaat: Printed Book
Taal:English
Gepubliceerd in: Bristol ; Institute of Physics Pub., 1998.
Reeks:Institute of physics series; no. 160
Onderwerpen:
Semiconductors--Defects--Congresses. > Image processing--Congresses.

PHY

Exemplaargegevens van PHY
Plaatsingsnummer: 621.3815/2 DON
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