Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 /

Dades bibliogràfiques
Autor corporatiu: International Conference on Defect Recognition and Image Processing in Semiconductors Templin, Germany
Altres autors: Donecker, J., ed, Rechenberg, I., ed
Format: Printed Book
Idioma:English
Publicat: Bristol ; Institute of Physics Pub., 1998.
Col·lecció:Institute of physics series; no. 160
Matèries:
Semiconductors--Defects--Congresses. > Image processing--Congresses.

PHY

Detall dels fons de PHY
Signatura: 621.3815/2 DON
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