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Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 /

書誌詳細
団体著者: International Conference on Defect Recognition and Image Processing in Semiconductors Templin, Germany
その他の著者: Donecker, J., ed, Rechenberg, I., ed
フォーマット: Printed Book
言語:English
出版事項: Bristol ; Institute of Physics Pub., 1998.
シリーズ:Institute of physics series; no. 160
主題:
その他の書誌記述
物理的記述:xx, 524 p. : ill. ; 24 cm.
ISBN:0750305002