Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 /

ग्रंथसूची विवरण
निगमित लेखक: International Conference on Defect Recognition and Image Processing in Semiconductors Templin, Germany
अन्य लेखक: Donecker, J., ed, Rechenberg, I., ed
स्वरूप: Printed Book
भाषा:English
प्रकाशित: Bristol ; Institute of Physics Pub., 1998.
श्रृंखला:Institute of physics series; no. 160
विषय:
Semiconductors--Defects--Congresses. > Image processing--Congresses.
विवरण
भौतिक वर्णन:xx, 524 p. : ill. ; 24 cm.
आईएसबीएन:0750305002

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