Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 /

التفاصيل البيبلوغرافية
مؤلف مشترك: International Conference on Defect Recognition and Image Processing in Semiconductors Templin, Germany
مؤلفون آخرون: Donecker, J., ed, Rechenberg, I., ed
التنسيق: Printed Book
اللغة:English
منشور في: Bristol ; Institute of Physics Pub., 1998.
سلاسل:Institute of physics series; no. 160
الموضوعات:
Semiconductors--Defects--Congresses. > Image processing--Congresses.
الوصف
وصف مادي:xx, 524 p. : ill. ; 24 cm.
ردمك:0750305002

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