Cita APA

International Conference on Defect Recognition and Image Processing in Semiconductors Templin, Germany, Donecker, J., & Rechenberg, I. (1998). Defect recognition and image processing in semiconductors 1997: Proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997. Institute of Physics Pub..

Citación estilo Chicago

International Conference on Defect Recognition and Image Processing in Semiconductors Templin, Germany, J. Donecker, and I. Rechenberg. Defect Recognition and Image Processing in Semiconductors 1997: Proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) Held in Templin, Germany, 7-10 September 1997. Bristol: Institute of Physics Pub., 1998.

Cita MLA

International Conference on Defect Recognition and Image Processing in Semiconductors Templin, Germany, et al. Defect Recognition and Image Processing in Semiconductors 1997: Proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) Held in Templin, Germany, 7-10 September 1997. Institute of Physics Pub., 1998.