International Conference on Defect Recognition and Image Processing in Semiconductors Templin, Germany, Donecker, J., & Rechenberg, I. (1998). Defect recognition and image processing in semiconductors 1997: Proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997. Institute of Physics Pub..

International Conference on Defect Recognition and Image Processing in Semiconductors Templin, Germany, J. Donecker, a I. Rechenberg. Defect Recognition and Image Processing in Semiconductors 1997: Proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) Held in Templin, Germany, 7-10 September 1997. Bristol: Institute of Physics Pub., 1998.

International Conference on Defect Recognition and Image Processing in Semiconductors Templin, Germany, et al. Defect Recognition and Image Processing in Semiconductors 1997: Proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) Held in Templin, Germany, 7-10 September 1997. Institute of Physics Pub., 1998.