Carregant...
Laser diagnostics and photochemical processing for semiconductor devices : symposium held November 1982 in Boston, Massachusetts, U.S.A. /
| Autor corporatiu: | United States. Air Force. Office of Scientific Research |
|---|---|
| Altres autors: | Osgood, R. M., ed, Brueck, S. R. J., ed, Schlossberg, H. R., ed |
| Format: | Printed Book |
| Idioma: | English |
| Publicat: |
New York :
North-Holland,
c1983.
|
| Col·lecció: | Material research society symposia proceedings;
v. 17 |
| Matèries: |
Ítems similars
-
Laser annealing of semiconductors /
Publicat: (1982) -
Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A. /
Publicat: (1983) -
Lasers in materials processing /
Publicat: (1983) -
Cohesive properties of semiconductors under laser irradiation /
Publicat: (1983) -
Defects in semiconductors : proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A. /
Publicat: (1981)