Llwytho...
Ellipsometry: proceedings of the third international conference on wllipsometry
| Awduron Eraill: | Bashara, N. M., ed, Azzam, R. M. A., ed |
|---|---|
| Fformat: | Printed Book |
| Iaith: | English |
| Cyhoeddwyd: |
Amsterdam
North-Holland
1976
|
| Pynciau: |
Eitemau Tebyg
Llwytho...
Proceedings of The Third All India Conference of Dravidian Linguistics
Cyhoeddwyd: (1976)
Cyhoeddwyd: (1976)
Llwytho...
Proceedings Of The Third All India Conference of Dravidian Linguistics
Cyhoeddwyd: (1976)
Cyhoeddwyd: (1976)
Eitemau Tebyg
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Ellipsometry at the nanoscale/
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Infrared ellipsometry on semiconductor layer structures: Phonons, plasmons, and polaritons
gan: Schubert, Mathias
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Ellipsometry and polarized light
gan: Azzam, R M A
Cyhoeddwyd: (1977) -
Characterization of CdS based multilayer thin films useful for photovoltaic device fabrication using different techniques with emphasis on ellipsometry
gan: Sunny Mathew
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