تحميل...
Ellipsometry: proceedings of the third international conference on wllipsometry
| مؤلفون آخرون: | Bashara, N. M., ed, Azzam, R. M. A., ed |
|---|---|
| التنسيق: | Printed Book |
| اللغة: | English |
| منشور في: |
Amsterdam
North-Holland
1976
|
| الموضوعات: |
مواد مشابهة
-
Ellipsometry at the nanoscale/
منشور في: (2012) -
Infrared ellipsometry on semiconductor layer structures: Phonons, plasmons, and polaritons
بواسطة: Schubert, Mathias
منشور في: (2004) - Spectroscopic ellipsometry study of barrier width effect in self-organized InGaAs/GaAsQDs laser diodes /
-
Ellipsometry and polarized light
بواسطة: Azzam, R M A
منشور في: (1977) -
Characterization of CdS based multilayer thin films useful for photovoltaic device fabrication using different techniques with emphasis on ellipsometry
بواسطة: Sunny Mathew
منشور في: (1994)