Ellipsometry: proceedings of the third international conference on wllipsometry

Míreanna Comhchosúla

• Ellipsometry at the nanoscale/
  Foilsithe: (2012)
• Infrared ellipsometry on semiconductor layer structures: Phonons, plasmons, and polaritons
  le: Schubert, Mathias
  Foilsithe: (2004)
• Spectroscopic ellipsometry study of barrier width effect in self-organized InGaAs/GaAsQDs laser diodes /
• Ellipsometry and polarized light
  le: Azzam, R M A
  Foilsithe: (1977)
• Characterization of CdS based multilayer thin films useful for photovoltaic device fabrication using different techniques with emphasis on ellipsometry
  le: Sunny Mathew
  Foilsithe: (1994)