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Electron and ion microscopy and microanalysis : principles and applications /
| Huvudupphovsman: | |
|---|---|
| Materialtyp: | Printed Book |
| Språk: | English |
| Publicerad: |
New York :
Marcel Dekker,
c1982.
|
| Serie: | Optical engineering (Marcel Dekker, Inc.) ;
v. 1. |
| Ämnen: |
PHY
| Signum: |
502/.8/25 MUR 502/.8/25 MUR;1 |
|---|---|
| Exemplar | Status otillgänglig |
| Exemplar | Status otillgänglig |