Á lódáil...
Electron and ion microscopy and microanalysis : principles and applications /
| Príomhúdar: | |
|---|---|
| Formáid: | Printed Book |
| Teanga: | English |
| Foilsithe: |
New York :
Marcel Dekker,
c1982.
|
| Sraith: | Optical engineering (Marcel Dekker, Inc.) ;
v. 1. |
| Ábhair: |
PHY
| Gairmuimhir: |
502/.8/25 MUR 502/.8/25 MUR;1 |
|---|---|
| Cóip | Live Status Unavailable |
| Cóip | Live Status Unavailable |