Loading...
Electron and ion microscopy and microanalysis : principles and applications /
Hovedforfatter: | |
---|---|
Format: | Printed Book |
Sprog: | English |
Udgivet: |
New York :
Marcel Dekker,
c1982.
|
Serier: | Optical engineering (Marcel Dekker, Inc.) ;
v. 1. |
Fag: |
PHY
Klassifikationsnummer: |
502/.8/25 MUR 502/.8/25 MUR;1 |
---|---|
Kopi | Live Status Unavailable |
Kopi | Live Status Unavailable |