Llwytho...
Electron and ion microscopy and microanalysis : principles and applications /
| Prif Awdur: | |
|---|---|
| Fformat: | Printed Book |
| Iaith: | English |
| Cyhoeddwyd: |
New York :
Marcel Dekker,
c1982.
|
| Cyfres: | Optical engineering (Marcel Dekker, Inc.) ;
v. 1. |
| Pynciau: |
PHY
| Rhif Galw: |
502/.8/25 MUR 502/.8/25 MUR;1 |
|---|---|
| Copi | Nid yw'r Statws Byw ar Gael |
| Copi | Nid yw'r Statws Byw ar Gael |