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20200810152119.0 |
| 008 |
820728s1982 nyua b 001 0 eng |
| 082 |
0 |
0 |
|a 502/.8/25
|b MUR
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| 100 |
1 |
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|a Murr, Lawrence Eugene.
|9 3591
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| 245 |
1 |
0 |
|a Electron and ion microscopy and microanalysis :
|b principles and applications /
|c Lawrence E. Murr.
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| 300 |
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|a xiv, 793 p. :
|b ill. ;
|c 27 cm.
|
| 490 |
1 |
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|a Optical engineering ;
|v v. 1
|
| 653 |
|
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|a Electron microscopy
|a Field ion microscopy
|a Microprobe analysis
|
| 942 |
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|c BK
|6 _
|
| 260 |
|
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|a New York :
|b Marcel Dekker,
|c c1982.
|
| 020 |
|
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|a 0824715535
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| 830 |
|
0 |
|a Optical engineering (Marcel Dekker, Inc.) ;
|v v. 1.
|9 3590
|
| 999 |
|
|
|c 211904
|d 211904
|
| 952 |
|
|
|0 0
|1 0
|2 ddc
|4 0
|6 502825_MUR
|7 0
|9 270105
|a PHY
|b PHY
|d 2010-02-08
|o 502/.8/25 MUR
|p PHY007343
|r 2010-02-08
|t 1
|w 2010-02-08
|y BK
|
| 952 |
|
|
|0 0
|1 0
|2 ddc
|4 0
|6 502825_MUR1
|7 0
|9 270106
|a PHY
|b PHY
|d 2010-02-08
|o 502/.8/25 MUR;1
|p PHY008124
|r 2010-02-08
|t 2
|w 2010-02-08
|y BK
|