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00813cam a2200193 a 4500 |
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20200810151935.0 |
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910507s1991 nyua b 001 0 eng |
| 082 |
0 |
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|a 541.3/3
|b CZA
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| 245 |
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|a Ion spectroscopies for surface analysis /
|c edited by A.W. Czanderna and David M. Hercules.
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| 300 |
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|a xvii, 469 p. :
|b ill. ;
|c 24 cm.
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| 490 |
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|a Methods of surface characterization;
|v v. 2
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| 653 |
|
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|a Solids--Surfaces--Analysis
|a Secondary ion mass spectrometry
|a Surface chemistry
|
| 700 |
1 |
|
|a Czanderna, Alvin Warren., ed.
|9 3276
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| 700 |
1 |
|
|a Hercules, David M., ed.
|9 3277
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| 942 |
|
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|c BK
|6 _
|
| 260 |
|
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|a New York :
|b Plenum Press,
|c c1991.
|
| 020 |
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|a 0306437929
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| 999 |
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|c 211700
|d 211700
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| 952 |
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|0 0
|1 0
|2 ddc
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|6 54133_CZA
|7 0
|9 269772
|a PHY
|b PHY
|d 2010-02-05
|l 1
|o 541.3/3 CZA
|p PHY011336
|r 2013-02-22
|s 2013-02-11
|w 2010-02-05
|y BK
|