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Novel application of anomalous (resonance) X-ray scattering for structural characterization of disordered materials /
主要作者: | |
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格式: | Printed Book |
語言: | English |
出版: |
New York :
Springer-Verlag,
1984.
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主題: |
PHY
索引號: |
530.4 WAS |
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復印件 | Live Status Unavailable |