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Novel application of anomalous (resonance) X-ray scattering for structural characterization of disordered materials /
| Autore principale: | |
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| Natura: | Printed Book |
| Lingua: | English |
| Pubblicazione: |
New York :
Springer-Verlag,
1984.
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| Soggetti: |
PHY
| Collocazione: |
530.4 WAS |
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| Copia | Status in tempo reale non disponibile |