Á lódáil...
Novel application of anomalous (resonance) X-ray scattering for structural characterization of disordered materials /
Príomhúdar: | |
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Formáid: | Printed Book |
Teanga: | English |
Foilsithe: |
New York :
Springer-Verlag,
1984.
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Ábhair: |
PHY
Gairmuimhir: |
530.4 WAS |
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Cóip | Live Status Unavailable |