Lanean...
Novel application of anomalous (resonance) X-ray scattering for structural characterization of disordered materials /
| Egile nagusia: | |
|---|---|
| Formatua: | Printed Book |
| Hizkuntza: | English |
| Argitaratua: |
New York :
Springer-Verlag,
1984.
|
| Gaiak: |
PHY
| Sailkapena: |
530.4 WAS |
|---|---|
| Alea | Egoera zuzenean ez dago erabilgarri |