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Novel application of anomalous (resonance) X-ray scattering for structural characterization of disordered materials /
Autor principal: | |
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Formato: | Printed Book |
Lenguaje: | English |
Publicado: |
New York :
Springer-Verlag,
1984.
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Materias: |
PHY
Número de Clasificación: |
530.4 WAS |
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Copia | Estatus de actividad no disponible |