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Novel application of anomalous (resonance) X-ray scattering for structural characterization of disordered materials /
| Autor principal: | |
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| Format: | Printed Book |
| Idioma: | English |
| Publicat: |
New York :
Springer-Verlag,
1984.
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| Matèries: |
PHY
| Signatura: |
530.4 WAS |
|---|---|
| Còpia | Comprovació en temps real no disponible |