Lanean...
Novel application of anomalous (resonance) X-ray scattering for structural characterization of disordered materials /
| Egile nagusia: | |
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| Formatua: | Printed Book |
| Hizkuntza: | English |
| Argitaratua: |
New York :
Springer-Verlag,
1984.
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| Gaiak: |
| Deskribapen fisikoa: | vi, 183 p. : ill. ; 25 cm. |
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| ISBN: | 0387133593 |