Lanean...
X-ray microscopy : proceedings of the international symposium, Göttingen, Fed. Rep. of Germany, September 14-16, 1983 /
| Beste egile batzuk: | Schmahl, G., ed, Rudolph, D., ed |
|---|---|
| Formatua: | Printed Book |
| Hizkuntza: | English |
| Argitaratua: |
Berlin ;
Springer-Verlag,
1984.
|
| Saila: | Springer series in optical sciences;
v. 43 |
| Gaiak: |
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