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X-ray microscopy : proceedings of the international symposium, Göttingen, Fed. Rep. of Germany, September 14-16, 1983 /

Bibliographic Details
Other Authors: Schmahl, G., ed, Rudolph, D., ed
Format: Printed Book
Language:English
Published: Berlin ; Springer-Verlag, 1984.
Series:Springer series in optical sciences; v. 43
Subjects:
Description
Physical Description:ix, 345 p. : ill. (some col.) ; 24 cm.
ISBN:0387132716