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X-ray diffraction topography /
| Autor principal: | |
|---|---|
| Format: | Printed Book |
| Idioma: | English |
| Publicat: |
New York :
Pergamon Press,
1976.
|
| Col·lecció: | International series in the science of the solid state ; v. 10
Pergamon international library |
| Matèries: |
| LEADER | 00699cam a2200193 i 4500 | ||
|---|---|---|---|
| 005 | 20200810151757.0 | ||
| 008 | 751229s1976 nyu b 001 0 eng | ||
| 082 | 0 | 0 | |a 548/.83 |b TAN |
| 100 | 1 | |a Tanner, B. K. |9 2940 | |
| 245 | 1 | 0 | |a X-ray diffraction topography / |c by B. K. Tanner. |
| 300 | |a xiii, 174 p. ; |c 26 cm. | ||
| 490 | 0 | |a International series in the science of the solid state ; v. 10 | |
| 490 | 0 | |a Pergamon international library | |
| 653 | |a X-ray crystallography | ||
| 942 | |c BK |6 _ | ||
| 260 | |a New York : |b Pergamon Press, |c 1976. | ||
| 020 | |a 0080196926 | ||
| 999 | |c 211488 |d 211488 | ||
| 952 | |0 0 |1 0 |2 ddc |4 0 |6 54883_TAN |7 0 |9 269489 |a PHY |b PHY |d 2010-02-02 |o 548/.83 TAN* |p PHY007474 |r 2010-02-02 |w 2010-02-02 |y BK | ||