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00790nam a2200265 a 4500 |
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adlib96000001 |
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ViArRB |
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20160826100749.0 |
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960221s1955 dcuabcdjdbkoqu001 0deng d |
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|a 3-540-59129-X
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| 040 |
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|a Adlib
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| 082 |
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|a 535
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| 245 |
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|a Optical charecterization of epitaxial semiconductor layers
|
| 250 |
|
|
|
| 260 |
|
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|a Heideberg,
|b Springer Verlag,
|c 1996
|
| 300 |
|
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|a xiv, 429p.,
|b ,
|c Book
|
| 500 |
|
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|a International School of Photonics
|
| 653 |
|
|
|a optical charecterizationoptical charecterization
|
| 100 |
|
|
|a Bauer, Guenther
|
| 700 |
|
|
|a Ritcher, Wolfgang
|
| 942 |
|
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|c BK
|6 _
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| 942 |
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|c BK
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| 999 |
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