Lanean...
Accelerated testing: statistical models, test plans and data analysis
| Egile nagusia: | |
|---|---|
| Formatua: | Printed Book |
| Hizkuntza: | English |
| Argitaratua: |
New Jersey
John Wiley
2004
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| Gaiak: |
| Deskribapen fisikoa: | 601p. |
|---|---|
| ISBN: | 978-0-471-69736-7 |