IEEE Transactions on Reliability: Vol. 40, part.2(3-5), 1991. Electrical and Electronic Engineers.
Chicago Style aipamenaIEEE Transactions on Reliability: Vol. 40, Part.2(3-5), 1991. New York: Electrical and Electronic Engineers.
MLA aipamenaIEEE Transactions on Reliability: Vol. 40, Part.2(3-5), 1991. Electrical and Electronic Engineers.
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