IEEE Transactions on Reliability: Vol. 40, part.2(3-5), 1991. Electrical and Electronic Engineers.
استشهاد بنمط شيكاغوIEEE Transactions on Reliability: Vol. 40, Part.2(3-5), 1991. New York: Electrical and Electronic Engineers.
MLA استشهادIEEE Transactions on Reliability: Vol. 40, Part.2(3-5), 1991. Electrical and Electronic Engineers.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.