IEEE Transactions on Reliability: Vol. 40, part.1(1-2),1991. Electrical and Electronic Engineers.
Styl cytowania ChicagoIEEE Transactions on Reliability: Vol. 40, Part.1(1-2),1991. New York: Electrical and Electronic Engineers.
Styl cytowania MLAIEEE Transactions on Reliability: Vol. 40, Part.1(1-2),1991. Electrical and Electronic Engineers.
Uwaga: Te cytaty mogą odróżniać się od wytycznej twojego fakultetu..