IEEE Transactions on Reliability: Vol. 40, part.1(1-2),1991. Electrical and Electronic Engineers.
Citación estilo ChicagoIEEE Transactions on Reliability: Vol. 40, Part.1(1-2),1991. New York: Electrical and Electronic Engineers.
Cita MLAIEEE Transactions on Reliability: Vol. 40, Part.1(1-2),1991. Electrical and Electronic Engineers.
Warning: These citations may not always be 100% accurate.