IEEE Transactions on Reliability: Vol. R37, 1 to 5, 1988. Electrical and Electronic Engineers.
Chicago Style aipamenaIEEE Transactions on Reliability: Vol. R37, 1 to 5, 1988. New York: Electrical and Electronic Engineers.
MLA aipamenaIEEE Transactions on Reliability: Vol. R37, 1 to 5, 1988. Electrical and Electronic Engineers.
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