IEEE Transactions on Reliability: Vol. R21 to 22, 1972-73. Electrical and Electronic Engineers.
Chicago-стиль цитированияIEEE Transactions on Reliability: Vol. R21 to 22, 1972-73. New York: Electrical and Electronic Engineers.
MLA-цитированиеIEEE Transactions on Reliability: Vol. R21 to 22, 1972-73. Electrical and Electronic Engineers.
Предупреждение: эти цитированмия не могут быть всегда правильны на 100%.