IEEE Transactions on Reliability: Vol. R21 to 22, 1972-73. Electrical and Electronic Engineers.
Chicago Style citaatIEEE Transactions on Reliability: Vol. R21 to 22, 1972-73. New York: Electrical and Electronic Engineers.
MLA citatieIEEE Transactions on Reliability: Vol. R21 to 22, 1972-73. Electrical and Electronic Engineers.
Let op: Deze citaties zijn niet altijd 100% accuraat.