IEEE Transactions on Reliability: Vol. R21 to 22, 1972-73. Electrical and Electronic Engineers.
Style de citation ChicagoIEEE Transactions on Reliability: Vol. R21 to 22, 1972-73. New York: Electrical and Electronic Engineers.
Style de citation MLAIEEE Transactions on Reliability: Vol. R21 to 22, 1972-73. Electrical and Electronic Engineers.
Attention : ces citations peuvent ne pas être correctes à 100%.