APA aipamena

IEEE Transactions on Reliability: Vol. R21 to 22, 1972-73. Electrical and Electronic Engineers.

Chicago Style aipamena

IEEE Transactions on Reliability: Vol. R21 to 22, 1972-73. New York: Electrical and Electronic Engineers.

MLA aipamena

IEEE Transactions on Reliability: Vol. R21 to 22, 1972-73. Electrical and Electronic Engineers.

Kontuz: berrikusi erreferentzia hauek erabili aurretik.