IEEE Transactions on Reliability: Vol. R21 to 22, 1972-73. Electrical and Electronic Engineers.
Chicago Edition CitationIEEE Transactions on Reliability: Vol. R21 to 22, 1972-73. New York: Electrical and Electronic Engineers.
Cita MLAIEEE Transactions on Reliability: Vol. R21 to 22, 1972-73. Electrical and Electronic Engineers.
Atenció: Aquestes cites poden no estar 100% correctes.