IEEE Transactions on Reliability: Vol. R21 to 22, 1972-73. Electrical and Electronic Engineers.
استشهاد بنمط شيكاغوIEEE Transactions on Reliability: Vol. R21 to 22, 1972-73. New York: Electrical and Electronic Engineers.
MLA استشهادIEEE Transactions on Reliability: Vol. R21 to 22, 1972-73. Electrical and Electronic Engineers.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.