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Defects control in semiconductors : proceedings of the conference on the science and technology of defect control in semiconductors, The Yokohama 21st century forum, Yokohama, Japan, Sept. 17-22: 1989

書目詳細資料
主要作者: Sumib, K. [ed.] (ed.by)
企業作者: International conference on the science and technology of defect control in semiconductors
格式: Printed Book
語言:English
出版: Amsterdam North-Holland 1990
主題:

UL

持有資料詳情 UL
索引號: 621.382:620.1 SUM
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